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6 articles for “built-in self test (BIST)”
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Survey on Built in Self-Test (BIST) for FPGA Application
Abstract: The integration of Field- Programmable Gate Arrays (FPGAs) in various applications has surged in recent years due to their flexibility and reconfigurability. However, ensuring the reliability and functionality of these FPGAs is a critical concern. Built-in Self-Test (BIST) techniques have emerged as a promising solution to address this challenge by providing on-chip testing capabilities. This survey explores the landscape of BIST methodologies specifically tailored for FPGA applications. The study delves …
Published in Journal of VLSI Design Tools and Technology · Vol. 13, Issue 3, 2023 · pp. 13–18 Read article
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The Emerging Technologies in the Field of Semiconductors Along with the Use of the System on Chip
Abstract: An entire electronic or computer system can be combined onto a single platform using a system on chip, which is effectively an integrated circuit. The primary objectives underlying the development of this system on chip are to decrease energy waste, cut costs, and decrease the area occupied by massive systems. Students can understand and experience many methods utilised at each level of the design hierarchy using this strategy. The expansion …
Published in Journal of Semiconductor Devices and Circuits · Vol. 10, Issue 1, 2024 · pp. 8–15 Read article
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A Common Mode Scan Based BIST for Stuck-at-Fault and Path Delay Fault
Abstract: Testing for delay and stuck-at faults requires two pattern tests and test sets are usually large. Built-in self-test (BIST) scheme is attractive for comprehensive testing. The BIST test pattern generators (TPGs) for such testing should be designed to ensure high pattern-pair coverage. In the proposed work, necessary and sufficient conditions to ensure complete/maximal pattern-pair coverage for sequential circuit have been derived. A new test data-compression scheme is an effective approach …
Published in Journal of VLSI Design Tools and Technology · Vol. 8, Issue 2, 2018 · pp. 72–78 Read article
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Test Pattern Generator for Built-in Self-test
Abstract: Low power BIST implementation is the need of the hour as testing is the most power-consuming process of chip operations. The power consumed during testing is almost twice as the power consumed during normal circuit operation. This paper gives the comparative analysis of power consumed by an improvised LFSR on two devices under test. The research also gives a decrease in number of logic gates in the circuit which is …
Published in Journal of Microelectronics and Solid State Devices · Vol. 2, Issue 1, 2015 · pp. 1–5 Read article
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Implementation of UART with CALBO
Abstract: The increasing growth of submicron technology has resulted in the difficulty of VLSI testing for designers who always look for simple and cost effective logic structure to realize a complex function. Thus Automatic Testing Equipment (ATE) is becoming costly process for testing. To reduce the cost of testing the chips, Built in Self-Test (BIST) has emerged as a cheaper alternative. BIST is a design technique that allows the chip to …
Published in Journal of Microelectronics and Solid State Devices · Vol. 2, Issue 1, 2015 · pp. 6–12 Read article
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Fault Detection Attainment for Embedded Cores based on Software Test Routines
Abstract: The test circuitry is designed in built-in-self-test (BIST) technique involves a system that applies the test signals and observes the corresponding system response. In this technique, the framework is embedded directly into the system hardware. The testing process performs efficiently, fastly and more economically than using an external test setup. Self-testing of embedded processors based on the test routines is an emerging method, since it employs a test resource partitioning …
Published in Journal of VLSI Design Tools and Technology · Vol. 8, Issue 1, 2018 · pp. 1–6 Read article