STM Journals Peer-reviewed research from Consortium e-Learning Network

Journal of VLSI Design Tools and Technology

An Explicit Approach to Compare Crosstalk Noise and Delay in VLSI RLC Interconnect Modeled with Skin Effect with Step and Ramp Input

  1. shilpi lavania
  2. sunil kumar sharma

Abstract

As the technology is acquiring frequency of the Giga-hertz range noise and delay calculations andavoidance of such factors in VLSI interconnects have become dominant to be considered. This paperrepresents a comparison between the crosstalk noise voltage level measured when the RLC on-chipinterconnect was modeled when the skin effect was considered under step input and the crosstalk voltagemeasured when the RLC line was modeled with skin effect under ramp input. In this paper, we haveproposed a detailed discussion about the relevance of the input applied to any interconnect that can affectthe whole system integrity. The importance and dominance of the skin effect cannot be ignored. But apartfrom the high frequency effect like skin effect and proximity effect, it is also very important to observe thatthese factors may harm the system integrity if the wrong input is applied. This paper reflects theapproximated noise and delay variations in different cases of inputs applied to the Global RLC interconnect.Keywords: VLSI, RLC, interconnect, crosstalk, delay calculation
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