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• Published Subscription 8 Aug 2019

  An Explicit Approach to Compare Crosstalk Noise and Delay in VLSI RLC Interconnect Modeled with Skin Effect with Step and Ramp Input

  By shilpi lavania, sunil kumar sharma

  Abstract: As the technology is acquiring frequency of the Giga-hertz range noise and delay calculations andavoidance of such factors in VLSI interconnects have become dominant to be considered. This paperrepresents a comparison between the crosstalk noise voltage level measured when the RLC on-chipinterconnect was modeled when the skin effect was considered under step input and the crosstalk voltagemeasured when the RLC line was modeled with skin effect under ramp input. In …

  Published in Journal of VLSI Design Tools and Technology · Vol. 1, Issue 1-2-3, 2011 · pp. 1–8 Read article →