Very Large Scale Integrated.
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Survey on Built in Self-Test (BIST) for FPGA Application
Abstract: The integration of Field- Programmable Gate Arrays (FPGAs) in various applications has surged in recent years due to their flexibility and reconfigurability. However, ensuring the reliability and functionality of these FPGAs is a critical concern. Built-in Self-Test (BIST) techniques have emerged as a promising solution to address this challenge by providing on-chip testing capabilities. This survey explores the landscape of BIST methodologies specifically tailored for FPGA applications. The study delves …
Published in Journal of VLSI Design Tools and Technology · Vol. 13, Issue 3, 2023 · pp. 13–18 Read article