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2 articles for “UDSM.”
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Analysis and Characterization of Circuits for Leakage Power Reduction at Sub-50 nm in CMOS Circuits
Abstract: This paper analyzes various techniques to decrease leakage power in complementary metal oxide semiconductor (CMOS) very large scale integration (VLSI) circuits, because due to continuous scaling of CMOS technology there is improvement in speed of semiconductor devices and the side effect of this scaling is leakage power. With the development of technology in CMOS VLSI Circuit, length of transistors has been reduced and speed of operation is increasing simultaneously. As …
Published in Journal of Electronic Design Technology · Vol. 13, Issue 2, 2022 · pp. 11–22 Read article
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A Circuit Approach for CMOS VLSI Circuit Leakage Power Reduction
Abstract: Despite the fact that scaling CMOS technology boosted speed, leakage currents always remained an issue. The issue has gotten worse as the scaling has gone into the UDSM (ultra-deep-submicron) range. In order for the circuit to function effectively, these unwanted leakage currents must be reduced to a minimum. It is challenging to create these leakage-free nano-scale CMOS circuits. In this work, the issue of leakage power is addressed, which occurs …
Published in Research & Reviews: A Journal of Embedded System & Applications · Vol. 10, Issue 3, 2022 · pp. 7–18 Read article