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3 articles for “Read/Write Reliability”
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Performance and Analysis of 6T, 8T & 10T SRAM Cell in 28nm Technology
Abstract: Technology scaling into deep sub-micron regimes has significantly increased the design challenges of Static Random Access Memory (SRAM), particularly at the 28 nm technology node. As transistor dimensions shrink, SRAM cells become more vulnerable to stability degradation, leakage current, process variations, and reduced noise margins, which adversely affect overall memory performance and reliability. The conventional 6T SRAM cell remains widely used due to its compact structure and high storage density; …
Published in Journal of VLSI Design Tools and Technology · Vol. 16, Issue 2, 2026 Read article
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Development of Polymer Based SRAM Cell with Enhance Low Power Performance
Abstract: Low-power memory technologies are in high demand with the rapid growth of portable electronics and energy-efficient computing systems. Static random-access memory (SRAM) plays a crucial role in processors, cache memories, and system-on-chip applications due to their speed and reliability. Static Random Access Memory (SRAM) is typically implemented using complementary MOS (CMOS) technology, which integrates both PMOS (P-channel Metal–Oxide–Semiconductor) and NMOS (N-channel Metal–Oxide–Semiconductor) transistors. However, as technology scales to deep submicron …
Published in Journal of Polymer & Composites · Vol. 14, Issue 1, 2026 · pp. 1439–1448 Read article
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Mapping the Literature on Digital Payment: A Comprehensive Review and Bibliometric Analysis
Abstract: This study essentially performs a comprehensive and in-depth analysis of the current research on digital payment systems. It examines and evaluates 346 journal papers from reliable sources like Scopus and Web of Science that were published between 2015 and 2023. The study intends to give readers a thorough grasp of the state of the art in the field of digital payments research, pinpoint new directions, and emphasize important issues. Among …
Published in International Journal of Optical Innovations & Research · Vol. 2, Issue 1, 2024 · pp. 41–59 Read article