Read/Write Reliability
1 article · search the full text for this term
-
Performance and Analysis of 6T, 8T & 10T SRAM Cell in 28nm Technology
Abstract: Technology scaling into deep sub-micron regimes has significantly increased the design challenges of Static Random Access Memory (SRAM), particularly at the 28 nm technology node. As transistor dimensions shrink, SRAM cells become more vulnerable to stability degradation, leakage current, process variations, and reduced noise margins, which adversely affect overall memory performance and reliability. The conventional 6T SRAM cell remains widely used due to its compact structure and high storage density; …
Published in Journal of VLSI Design Tools and Technology · Vol. 16, Issue 2, 2026 Read article