Cobalt (Co) and manganese (Mn) co-doped zinc oxide (ZnO) thin films were prepared by sol-gel spin coating method on quartz substrate by varying the dopants concentration. Co0.02Mn0.08Zn0.90O; Co0.05Mn0.05Zn0.90O and Co0.08Mn0.02Zn0.90O thin films were deposited using different rates of cobalt acetate tetrahydarte, manganese acetate tetrahydrate and zinc acetate dihydrate solutions. The effects of dopants concentration were investigated by x-ray diffraction (XRD). The XRD pattern shows that the deposited films have polycrystalline hexagonal wurtzite structure. SEM micrograph indicates the changes in morphology of thin film as dopants concentration are varying. The compositional analysis carried out by energy dispersive scattering (EDS) spectra that confirm the presence of zinc, cobalt and manganese without any impurities. Keywords: Co and Mn doped ZnO, thin films, spin coating process, XRD, SEM, EDS
