Journal of Semiconductor Devices and Circuits

Predictive and Degradation Analysis in the Life-Cycle of Monocrystalline and Multicrystalline Photovoltaic Modules using Electroluminescence Imaging & Monitoring Studies

  1. Mohammed Irshad Waheed

Abstract

AbstractSolar Technology is the cynosure of all eyes in this global era. With major thrusts towards decarbonization, improving the overall efficiency of Solar Modules is the most coveted thing in this arena. The efficiency of a Solar panel ranges between 18-25 % when it is in good working condition. There are several causes of the efficiency decreasing further. A solar panel is susceptible to a lot of damages, ranging from defective manufacturing to mechanical shocks to wearing by weather conditions. It is thus of paramount importance that a PV panel be manufactured through stringent quality procedures & checks, handled with utmost care and be given routine inspections to ascertain its working conditions. A defective or faulty solar panel is the reason behind low output and quite a few faults. There are some methods to identify these faults, which are discussed at length in this paper. These tests are quite instrumental in predicting and monitoring the performance of a solar panel. With the onset of digital monitoring and image analysis, potential defects in a Photovoltaic panel are easily identifiable. These tests are carried out at predetermined intervals which give results that are then analysed. The detailed study of the outcome of these tests goes a long way to provide an overall picture of the panel’s working condition. One such test, Electroluminescence Imaging, has been dealt with at length in this paper.Keywords: PV, Faults, Monocrystalline, Imaging, TestsCite this ArticleMohammed Irshad Waheed. Predictive and Degradation Analysis in the Life-Cycle of Monocrystalline and Multicrystalline Photovoltaic Modules using Electroluminescence Imaging & Monitoring Studies Journal of Semiconductor Devices and Circuits. 2020; 7(2): 23–27p.
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