1 publication

• Published Subscription 12 Mar 2018

  Fault Detection Attainment for Embedded Cores based on Software Test Routines

  By Vishal Gangadhar Puranik, Dilip Devchand Shah

  Abstract: The test circuitry is designed in built-in-self-test (BIST) technique involves a system that applies the test signals and observes the corresponding system response. In this technique, the framework is embedded directly into the system hardware. The testing process performs efficiently, fastly and more economically than using an external test setup. Self-testing of embedded processors based on the test routines is an emerging method, since it employs a test resource partitioning …

  Published in Journal of VLSI Design Tools and Technology · Vol. 8, Issue 1, 2018 · pp. 1–6 Read article →