1 publication

• Published Subscription 10 May 2024

  Survey on Built in Self-Test (BIST) for FPGA Application

  By M. Fatima, Shubham Sahu

  Abstract: The integration of Field- Programmable Gate Arrays (FPGAs) in various applications has surged in recent years due to their flexibility and reconfigurability. However, ensuring the reliability and functionality of these FPGAs is a critical concern. Built-in Self-Test (BIST) techniques have emerged as a promising solution to address this challenge by providing on-chip testing capabilities. This survey explores the landscape of BIST methodologies specifically tailored for FPGA applications. The study delves …

  Published in Journal of VLSI Design Tools and Technology · Vol. 13, Issue 3, 2023 · pp. 13–18 Read article →