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• Published Subscription 8 Aug 2019

  Modelling of Skin Effect in On-Chip VLSI RLC Global Interconnect

  By vikas maheshwari, shilpi lavania, rajib kar, durbadal mandal, A. K. Bhattacharjee

  Abstract: This paper addresses one of the aspects of the high frequency effects, namely the skin effect. The basicproblem with skin effect is that it attenuates the high frequency components of a signal more than that ofthe low frequency components. Due to the increase in operating frequency and die sizes, RC models arebecoming insufficient for analysis of global VLSI interconnects. Accurate noise modelling for RLC lines isthus critical for timing and …

  Published in Journal of VLSI Design Tools and Technology · Vol. 1, Issue 1-2-3, 2011 · pp. 31–44 Read article →