X-ray diffractometer
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Preparation and Characterization of Aluminium Doped ZnO Thin Films by Spin Coating Technique
Abstract: In this work, the preparation of Al-doped ZnO (AZO) thin films by the sol-gel spin-coating method is reported. The structural properties and surface morphologies of film prepared at RT were characterized by X-ray diffraction (XRD) and field emission scanning electron microscope (FE-SEM). The XRD and SEM results disclosed that the crystallization quality and grain size of as-prepared films were highly influenced by Al doping. Laser Raman Spectrometer results indicated that …
Published in Journal of Thin Films, Coating Science Technology & Application · Vol. 7, Issue 2, 2020 · pp. 16–22 Read article