voltage scaling
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Study and Analysis of Delay Faults of Embedded Processor using Dynamic Voltage Scaling Methods
Abstract: Voltage over-scaling has been a possibility for energy dependability compromise. This research will look into its effectiveness and the potential for rationale deferral flaws. Our contextual investigation on an ARM Cortex-M0 processor with business 45 nm libraries shows that the quantity of defer deficiencies increments decisively after the principal bombing working point which infers that voltage overscaling will be wasteful after the basic working point. This recommends the need of …
Published in Research & Reviews: A Journal of Embedded System & Applications · Vol. 10, Issue 1, 2022 · pp. 15–19 Read article