Roughness of the thin film
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Structural and Morphological Studies of MgO Thin Film on ITO Substrate
Abstract: MgO thin film was prepared by electrodeposition technique on ITO plate and characterized by X-ray diffractometer analysis and its size was in the range of 44 nm and its predominant peak was (311). The film was deposited on ITO plate and these thin films were prepared for device fabrication. The following qualities of the host material i.e., structure, optimum stoichiometry and surface morphological changes etc., are essential, which are the …
Published in Journal of Refrigeration, Air conditioning, Heating and ventilation · Vol. 6, Issue 3, 2019 · pp. 38–47 Read article