expansion method

1 article · search the full text for this term

• Published Subscription 25 May 2022

  Reflectance analysis for SOI application using semiconductor materials

  By Kali Prasanna Swain, A. Mahapatra, C.S. Mishra, S. Behera, G. Palai

  Abstract: This work comprehensively investigates the high reflectance of semiconductor-glass (InP-FS, GaAs-BSG, Ge-BK7, Ge-BSG,GaAs-FS) grating SOI structure at wavelength 1.55m. The simulation results indicated that the reflectivities for InP-FS, Ge-BSG, Ge-BK7, GaAs-FS, and GaAs-BSG grating SOI structures are 99.01 percent, 99.03 percent, 99.20 percent, and 99.29 percent, 99.47 percent at wavelength 1.55m, respectively. The plane wave expansion approach is used in this simulation. When compared to the old outcome, the current …

  Published in Journal of Semiconductor Devices and Circuits · Vol. 9, Issue 1, 2022 · pp. 34–38 Read article →