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3 articles for “CuxO”
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Opto-electrical and Structural Properties of CuxO Thin Films grown by R. F. Sputtering Method
Abstract: CuxO (0<x<1) thin films were deposited on glass substrate by r. f. sputtering method at different r. f. power in an atmosphere of O2 and Ar. The conditions for deposition of CuxO thin film were optimized by varying the r. f. power for the deposition to vary the energy band gap of the deposited film. Structural characterizations were performed by XRD and TEM studies. The films deposited on glass substrate …
Published in Journal of Alternate Energy Sources & Technologies · Vol. 2, Issue 1, 2011 · pp. 8–15 Read article
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Electrical Properties of Nanocrystalline CuxO Thin Films Prepared by r. f. Sputtering Method
Abstract: Normal 0 Nanocrystalline CuxO (0 < x < 1) thin films have been synthesized using r. f. sputtering method at different r. f. power in an atmosphere of O2 and Ar. The effect of varying r. f. power, oxygen partial pressure and film thickness during deposition on the crystal size and electrical properties of CuxO thin films have been studied. The films were characterized by X-ray diffraction (XRD), transmission electron …
Published in Journal of Nanoscience, NanoEngineering & Applications · Vol. 3, Issue 2, 2013 · pp. 30–37 Read article
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Specific Contact Resistance of CuxO Thin Films Deposited by r. f. Sputtering Method
Abstract: Normal 0 MicrosoftInternetExplorer4 This paper contains measurement of contact resistivity and bulk resistivity of CuxO (0<x<1) thin films deposited by r. f. sputtering method. The conditions for deposition of CuxO thin film were optimized by varying the r. f. power to vary the contact resistivity and bulk resistivity. Electrical characterizations were performed by Transmission Line Model (TLM) and Vertical Transmission Model (VTM) studies. The films deposited on glass substrate have …
Published in Journal of Alternate Energy Sources & Technologies · Vol. 3, Issue 3, 2012 · pp. 10–16 Read article