The Scanning Kelvin Probe (SKP) Method is an indirect method to measure the electrochemical potential of a metal. Thus, in order to determine the potential of a given metal it is necessary to measure the Volta potential between it and an electrochemical reference electrode. Various designs of probes were developed to further improve the overall performance of the SKP system. Five novel probes were designed and tested with the SKP system, probes were tested under certain parameters, corrosion potential measurements, height dependence and reproducibility. The tungsten wire probe was shown to be ‘best’ design for the SKP system. Keywords: Scanning Kelvin Probe (SKP), Volta potential, EMF, Parallel Plate Capacitor, Work Function, Kelvin Potential
