STM Journals Peer-reviewed research from Consortium e-Learning Network

Journal of Aerospace Engineering & Technology

Advanced x-Ray Analysis for Less-Crystalline Materials

  1. Prantik Mukhopadhyay
  2. A. K. Singh

Abstract

An effort to manufacture materials with the least and precise radar signature for stealth and controlled guidance respectively, inevitably requires advanced techniques to characterize materials, for detecting the confinement of crystallinity in still smaller volumes, to estimate entity sizes, unwanted noise and structure factors. Raison d’etre for selection of advanced and special materials with less crystallinity, combined with control over precise weathering, to minimize crystal development, for acquiring stealth and targeting with an extended speed of hypersonic vehicles, deserve scientific derivatives of energetics and kinetics.
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