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Advanced x-Ray Analysis for Less-Crystalline MaterialsBy Prantik Mukhopadhyay, A. K. Singh
Abstract: An effort to manufacture materials with the least and precise radar signature for stealth and controlled guidance respectively, inevitably requires advanced techniques to characterize materials, for detecting the confinement of crystallinity in still smaller volumes, to estimate entity sizes, unwanted noise and structure factors. Raison d’etre for selection of advanced and special materials with less crystallinity, combined with control over precise weathering, to minimize crystal development, for acquiring stealth and …
Published in Journal of Aerospace Engineering & Technology · Vol. 12, Issue 1, 2022 · pp. 8–12 Read article →