1 publication

• Published Subscription 29 May 2024

  Reduce the Leakage Current and Power in VLSI Technology

  By Nisha Sharma, Laxmi Singh, Shilpa Tripathi

  Abstract: Demand for portability Reduce and increase in size, low cost, low dynamic power, low leakage current, low sub threshold current, and the necessity to minimise at least one of these. Circuit complexity increases with circuit integration. Memory and microprocessors are included in mass-produced chips. Microcomputer systems central system memory uses dynamic random-access memory (DRAM). One benefit of DRAM memory is its high speed and capacity integration. The examination of DRAM …

  Published in Journal of VLSI Design Tools and Technology · Vol. 13, Issue 3, 2023 · pp. 19–25 Read article →