1 publication
-
Published Subscription
Virtual Fabrication and Analog Performance of Sub-40nm Bulk MOSFETBy S Intekhab Amin, M. S. Alam
Abstract: Virtual Fabrication of sub-40nm Bulk MOSFET is carried out under channel engineering and source drain engineering process. These structures enable more aggressive device scaling in nano-scale region because of their ability to control short channel effects. How ever during scaling the junction depth should also be scaled down, which increases parasitic resistance so silicidation technique has been applied to reduce their effects on device. Analog performance has been measured in …
Published in Journal of Electronic Design Technology · Vol. 1, Issue 1-3, 2011 · pp. 34–40 Read article →