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Power-Efficient Design Strategies for Static Random Access Memory with Memory Blocks: A ReviewBy Biswaranjan Barik, P. V. Dileep Bhumireddi
Abstract: For many years, CMOS technology has been able to achieve high integration density and great performance by scaling down its feature size and threshold voltage. Power consumption has been a major concern in VLSI design due to the ongoing drop in aspect ratio and the related improvements in chip density and operation frequency. SRAM is a type of random-access memory in which an interruption in power causes data loss. For …
Published in Journal of Microcontroller Engineering and Applications · Vol. 10, Issue 3, 2023 · pp. 23–32 Read article →