1 publication

• Published Subscription 2 Feb 2021

  Implementation of UART with CALBO

  By Nishtha Singh, Sangeeta Mangesh

  Abstract: The increasing growth of submicron technology has resulted in the difficulty of VLSI testing for designers who always look for simple and cost effective logic structure to realize a complex function. Thus Automatic Testing Equipment (ATE) is becoming costly process for testing. To reduce the cost of testing the chips, Built in Self-Test (BIST) has emerged as a cheaper alternative. BIST is a design technique that allows the chip to …

  Published in Journal of Microelectronics and Solid State Devices · Vol. 2, Issue 1, 2015 · pp. 6–12 Read article →