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2 publications

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    Structural and Morphological Studies of MgO Thin Film on ITO Substrate

    By P. Baby Shalini, A. Ayeshamariam, N. Nagarani, S. Naseema Banu, S. Neelaveni

    Abstract: MgO thin film was prepared by electrodeposition technique on ITO plate and characterized by X-ray diffractometer analysis and its size was in the range of 44 nm and its predominant peak was (311). The film was deposited on ITO plate and these thin films were prepared for device fabrication. The following qualities of the host material i.e., structure, optimum stoichiometry and surface morphological changes etc., are essential, which are the …

    Published in Journal of Refrigeration, Air conditioning, Heating and ventilation · Vol. 6, Issue 3, 2019 · pp. 38–47 Read article

  • Published Subscription

    Studies on the preparation and characterization of TiO2 thin film

    By P. Dhanalakshmi, R. Abirami, G. Rathika, V. Murugavalli, A. Ayeshamariam, N. Nagarani, M. Jayachandran

    Abstract: Titanium dioxide thin film was deposited on the class substrate by using Ti(C10H14O5), and characterized by using X-Ray diffractometer (XRD) and scanning electron microscopy (SEM), SEM analysis was discussed for 350º C. FTIR analysis gives the vibrational modes of vibrations of the material. The diffraction plane is (101) and crystal size was as 50 nm. The morphological studies of the sample inferred that the size was nearly in micrometer due …

    Published in Journal of Nanoscience, NanoEngineering & Applications · Vol. 8, Issue 3, 2018 · pp. 58–64 Read article

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