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A Survey on Recent Approaches for Leakage Power Reduction in MOS Integrated CircuitsBy harshvardhan upadhyay
Abstract: Today the integrated circuit’s functionalities are increasing day by day with increase in the number of transistors in it. However, the scaling of the transistors, top increase its number, for the same area of an IC reduces its sub-threshold voltage with its increase in the leakage power consumption. Scaling at different scales (45, 60, 90 nm, etc.) leads to major losses, both at static and dynamic phases of the circuits. …
Published in Journal of VLSI Design Tools and Technology · Vol. 4, Issue 2, 2014 · pp. 24–31 Read article →