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On-Wafer Calibration of Vector Network Analyzer – Fabrication of LRM Calibration StandardBy Nishtha Chopra, Dr. S. K. Koul, M. U. Sharma
Abstract: Vector network analyzer or VNA has become ascendant of most measuring networks above 1 GHz. These networks consist of various manufacturing defects (due to resistance, capacitance and inductance) including VNA errors. To measure these errors, VNA was calibrated using a calibration kit. The usage of this calibration kit squanders a lot of time and money; moreover, the results are not accurate. To avoid this, the concept of on-wafer calibration is …
Published in Journal of Electronic Design Technology · Vol. 1, Issue 1-3, 2011 · pp. 18–25 Read article →