1 publication

• Published Subscription 9 Aug 2019

  A New TGC-Differential Input Stage to Modify Dynamic Comparator

  By anurag sharma, gurinderpal singh

  Abstract: As the technology rapidly scaling down, the escalating demand for higher accuracy is putting a heavy pressure to find ways to get rid of one of the major issues among present day dynamic comparators i.e. random offset voltage generation. A number of offset calibration techniques have been presented to resolve this issue. It has become an important concern to analyze these techniques for scaled down technology nodes to cop up …

  Published in Journal of VLSI Design Tools and Technology · Vol. 6, Issue 2, 2016 · pp. 74–85 Read article →