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3 articles for “Page fault”
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Page Replacement Techniques: A Review
Abstract: Page replacement algorithms are utilized for virtual memory the executives and it causes the OS to choose which memory page can be moved out, making space for the as of now required page. Each algorithm fulfills the objective of reducing the number of page faults and increase page hits in different manners that will increase the performance of the process. This paper tells about the main page replacement algorithms LRU, …
Published in Recent Trends in Parallel Computing · Vol. 8, Issue 3, 2021 · pp. 9–16 Read article
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Developing Operating System Simulation Software for Windows Based System by C# .NET Framework and an Android Application by JAVA and XML
Abstract: AbstractThe academic course named operating system (OS) is very important for undergraduate students in computer science and engineering (CSE) related discipline. In this course, the teachers mainly deliver lectures on the fundamentals issues of OS, process scheduling, paging, deadlocks handling etc. In this paper, windows OS based desktop simulation software has been developed with a view to coordinating the teachers and students to conduct the OS course interactively. Also, the …
Published in Journal of Operating Systems Development & Trends · Vol. 4, Issue 1, 2017 · pp. 9–18 Read article
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Application of B-trees for Design of Optimal Page Replacement Technique in Modern Operating Systems
Abstract: Algorithms related to replacing the memory pages in operating systems are critical components of modern operating systems that manage virtual memory efficiently. Current algorithms such as LRU (Least Recently Used), Clock algorithms as well as FIFO (First-In-First-Out), often struggle with the increasing demands of contemporary applications and larger memory hierarchies. This research work proposes a novel approach utilizing B-tree data structures to design an optimal page replacement technique. The proposed …
Published in International Journal of Data Structure Studies · Vol. 3, Issue 2, 2025 · pp. 23–30 Read article