STM Journals Peer-reviewed research from Consortium e-Learning Network

Research & Reviews : Journal of Space Science & Technology

Advanced x-Ray Analysis for Less-Crystalline and Complex Materials

  1. Prantik Mukhopadhyay

Abstract

An effort to manufacture materials with the least and precise radar signature for stealth and controlled guidance respectively, essentially uses advanced techniques to characterize materials, for detecting crystal confinement in still smaller volumes, to estimate entity sizes, unwanted noise and structure factors. Raison d’etre for selection of advanced and special materials with less crystallinity, combined with precise control over weathering, to minimize crystal developments, for acquiring stealth and targeting with an extended speed of hypersonic vehicles, deserve scientific derivatives of energetics and kinetics.

Keywords

Support