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Designing and Analysis of a Negative Bias Temperature Instability Sensing CircuitBy Deepjyoti Kalita, Partha Pratim Saikia, Debaprasad Das
Abstract: Scale down the size of devices introduce the effect of negative bias temperature instability (NBTI), positive bias temperature instability (PBTI), and hot carrier injection (HCI) in very-large-scale integration (VLSI) chip design and the major concern is to minimize these effects to a nominal value. In the paper, authors focus in minimization of NBTI effect and develop a noble degradation monitoring sensor circuit named SCHIMOS. A comparison is stated between an …
Published in Research & Reviews: A Journal of Embedded System & Applications · Vol. 8, Issue 1, 2020 · pp. 6–11 Read article →