1 publication

  • Published Subscription

    A Comparative Analysis of Characterization of Silicon Nanowire and CNT FETs

    Abstract: The CMOS technology has been replaced by nano-scale semiconductor devices for future nanotechnology. These nano scale semiconductor devices have been replaced by nanowire FET and CNT FET due to their outstanding device physics. In this paper, a comparative analytical study on the basis of their operation, characteristics, structure and design has been investigated. HSPICE has been used to simulate CNT FET and comparison has been done with nanowire FET. The …

    Published in Journal of Nanoscience, NanoEngineering & Applications · Vol. 10, Issue 2, 2020 · pp. 37–49 Read article

Read more of it

Subscribe to one journal or build your own list of several. One invoice, one payment, access for a full year.

Subscribe to journals →

Publish your article

Peer-reviewed journals across every subject, with open access options. Send your manuscript to the right editor today.

Publish with us → Calculate your APC
Support