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• Published Subscription 29 Jan 2018

  Analytical Analysis for Porous Silicon to Compute Porosity Using Optical Sensing Device

  By Gopinath Palai, Bhopendra Singh

  Abstract: This paper investigates the percentage of porosity in silicon using optical device. During the measurement of porosity, reflections as well as absorption losses are included to find out the transmitted intensity. Analytical results for the same reveals that reflectance, absorbance as well as transmittance vary linearly with respect to different percentage of porosity in the silicon. It is also seen that transmitted intensity through silicon varies linearly with respect to …

  Published in Recent Trends in Sensor Research & Technology · Vol. 4, Issue 2, 2017 · pp. 1–5 Read article →